SWAIN, D.; LAKUM, S.; PATEL, S.; PATRO, P.; JATIN. An Efficient Crop Yield Prediction System Using Machine Learning. EAI Endorsed Transactions on Internet of Things, [S. l.], v. 10, 2024. DOI: 10.4108/eetiot.5333. Disponível em: https://publications.eai.eu/index.php/IoT/article/view/5333. Acesso em: 13 may. 2024.