Bagavath Singh, R., Kumar, G., Sultania, G., Shrikant Agashe, S., Ranjan Sinha, P., & Kang, C. (2019). Deep Learning based MURA Defect Detection. EAI Endorsed Transactions on Cloud Systems, 5(15), e6. https://doi.org/10.4108/eai.16-7-2019.162217