BAGAVATH SINGH, Ramya; KUMAR, Gaurav; SULTANIA, Gaurav; SHRIKANT AGASHE, Shashank; RANJAN SINHA, Priya; KANG, Chulmoo. Deep Learning based MURA Defect Detection. EAI Endorsed Transactions on Cloud Systems, [S. l.], v. 5, n. 15, p. e6, 2019. DOI: 10.4108/eai.16-7-2019.162217. Disponível em: https://publications.eai.eu/index.php/cs/article/view/2486. Acesso em: 2 jan. 2026.