PATHAK, R.; KUMAR DEWAN, V.; BHAT, A. Random verification Strategy for Microcontroller based Subsystems for faster Convergence. EAI Endorsed Transactions on Cloud Systems, [S. l.], v. 5, n. 15, p. e3, 2019. DOI: 10.4108/eai.16-7-2019.162214. Disponível em: https://publications.eai.eu/index.php/cs/article/view/2483. Acesso em: 16 may. 2024.