BAGAVATH SINGH, R.; KUMAR, G.; SULTANIA, G.; SHRIKANT AGASHE, S.; RANJAN SINHA, P.; KANG, C. Deep Learning based MURA Defect Detection. EAI Endorsed Transactions on Cloud Systems, [S. l.], v. 5, n. 15, p. e6, 2019. DOI: 10.4108/eai.16-7-2019.162217. Disponível em: https://publications.eai.eu/index.php/cs/article/view/2486. Acesso em: 16 may. 2024.