LIU, Jiamin; SUN, Yuhui. Relative Position Encoding-Enhanced Vision Transformer for Image-Level Defect Classification in Manufacturing Textured-Surface Inspection. EAI Endorsed Transactions on Scalable Information Systems, [S. l.], v. 13, n. 3, 2026. DOI: 10.4108/eetsis.13596. Disponível em: https://publications.eai.eu/index.php/sis/article/view/13596. Acesso em: 26 sep. 2026.