KAUR, H.; SHARMA, S. K. Reliability and Mean Time to System Failure of a Parallel System’ by Using One or Two Decimal Random Data Points. EAI Endorsed Transactions on Scalable Information Systems, [S. l.], v. 11, n. 3, 2024. DOI: 10.4108/eetsis.5071. Disponível em: https://publications.eai.eu/index.php/sis/article/view/5071. Acesso em: 22 jul. 2024.