Secure Data Fusion Analysis on Certificateless Short Signature Scheme Based on Integrated Neural Networks and Elliptic Curve Cryptography

Authors

  • Lina Zou Shenyang Normal University image/svg+xml
  • Xueying Wang Shenyang Normal University image/svg+xml
  • Lifeng Deng Liaoning Rongke Zhiwei Cloud Technology Co

DOI:

https://doi.org/10.4108/eai.14-9-2021.170952

Keywords:

Certificateless short signature scheme, Secure data fusion, Elliptic curve cryptography, Integrated neural networks

Abstract

In the traditional public key cryptosystem based on certificates, the issuance and management of user certificates are realized through the authoritative certificate center, but amount of time is spent in the transmission and verification of user public key certificates. After a malicious user obtaining legitimate users’ private keys, he can select a secret value and signature process to generate the final private key, public key and signature. And he will announce that he is the legal user, while others are unable to distinguish this process. This is the defect of traditional digital signature scheme without certificate. Therefore, this paper proposes a certificateless short signature scheme based on integrated neural networks and elliptic curve cryptography for secure data fusion analysis. The security of the solution is based on Inv-CDH problem. The complete security proof is given under the stochastic predictor model. It is proved that the new model can resist existence forgery in adaptive selective message attack with new adversary. Experiment results show that the calculation amount of our proposed certificateless short signature scheme is small and the efficiency is high compared with other state-of-the-art schemes.

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Published

14-09-2021

How to Cite

1.
Zou L, Wang X, Deng L. Secure Data Fusion Analysis on Certificateless Short Signature Scheme Based on Integrated Neural Networks and Elliptic Curve Cryptography. EAI Endorsed Scal Inf Syst [Internet]. 2021 Sep. 14 [cited 2024 May 8];9(34):e3. Available from: https://publications.eai.eu/index.php/sis/article/view/355