Reliability and Mean Time to System Failure of a Parallel System' by Using One or Two Decimal Random Data Points

Authors

DOI:

https://doi.org/10.4108/eetsis.5071

Keywords:

Mean time to system failure, MTSF, Weibull distribution, Parallel system, Series system, Failure rate

Abstract

Focusing on Weibull failure rules, which govern the stopping of components, this work evaluates reliability metrics such as stability and the mean time to system failure (MTSF) of a structure that is parallel. These metrics' behaviour has been seen for one or two decimal random values of component failure rates, operation times, form parameters, and the total quantity of components used in the parallel structure. In order to analyze the variation in the ethics of reliability as well as MTSF, the particular case of the Weibull distribution has also been taken up.

References

Permila, Malik SC, Munday VJ. A 2-out-of-2: G System with Single Cold Standby and Priority to Repair over Replacement. Int. J. of Statistics and Systems. 2016; 11: 27-36.

Chauhan SK, Malik SC. Reliability Measures of a Series System with Weibull Failure Laws. Int. J. of Statistics and Systems. 2016; 11(2): 173-186.

Moskowitz F, Mclean JB. Some Reliability Accepts of system Design. IRE Transactions Reliability and Quality Control. 1956; 8: 7-35.

Birnbaum ZW, Saunders SC. A Statistical Model for Life-Length of Materials. J. of Amer. Statistical Society. 1958; 53: 151-160.

Kao JHK. Computer Methods for Estimating Weibull Parameters in Reliability Studies. Trans. on Reliability and Quality Control. 1958; 13: 15-22.

Kneale SG. Reliability of Parallel Systems with Repair and Switching. Proc. Seventh National Symposium on Relia. and Qual. Control. 1961; 45:129-133.

Sandler GI. System Reliability Engineering. Prentice Hall. Englewood Cliffs. 1963; 13: 1-11.

Basu AP. Estimates of Reliability for Some Distributions useful in Lift-Testing. Techno metrics. 1964; 6: 215-219.

Berretoni JN. Practical applications of the Weibull Distribution. Int. Qual. Control. 1964; 21: 71-79.

Kaur H, Sharma SK. Exploration on Reliability Theory using LGCM Model in Neural Network. Advances in Mathematics Scientific Journal. 2020; 9: 5349-5359.

Barlow RE. Mathematical theory of reliability: a historical perspective. IEEE Transactions on Reliability. 1984; 33: 16-20.

Shukla DK, Arul AJ. A smart component methodology for reliability analysis of dynamic systems. Annals of Nuclear Energy. 2019; 133: 863-880.

Wang D, Jiang C, Park C. Reliability analysis of load-sharing systems with memory. Lifetime Data Analysis. 2019; 25: 341-360.

Burton RM, Howard GT. Optimal system reliability for a mixed series and parallel structure. Journal of Mathematical Analysis and Applications. 2019; 28: 370-382.

Granig W, Faller LM, Zang H. Sensor system optimization to meet reliability targets. Microelectronics Reliability. 2018; 87: 113-124.

Kaur H, Sharma SK. Measures of a Series System's Reliability for One or Two Decimal Random Data Points. 3rd International Conference on Issues and Challenges in Intelligent Computing Techniques (ICICT). 2022; 1-7.

Xu G, Du X, Li Z, Zhang X, Zheng M, Miao Y, Liu Q. Reliability design of battery management system for power battery. Microelectronics Reliability. 2018; 88: 1286-1292.

Abuta E, Tian J. Reliability over consecutive releases of a semiconductor optical endpoint detection software system developed in a small company. Journal of Systems and Software. 2018; 137: 355-365.

Ivnov V, Reznik A, Succi G. Comparing the reliability of sofware systems: A case study on mobile operating system. Information Sciences. 2018; 423: 398-411.

Utkin LV, Coolen FP. A robust weighted SVR-based software reliability growth model. Reliability Engineering & System Safety. 2018; 176: 93-101.

Pundir PS, Gupta PK. Reliability estimation in load-sharing system model with application to real data. Annals of Data Science. 2018; 5: 69-91.

Downloads

Published

08-02-2024

How to Cite

1.
Kaur H, Sharma SK. Reliability and Mean Time to System Failure of a Parallel System’ by Using One or Two Decimal Random Data Points. EAI Endorsed Scal Inf Syst [Internet]. 2024 Feb. 8 [cited 2024 May 20];11(3). Available from: https://publications.eai.eu/index.php/sis/article/view/5071